Advances in Imaging and Electron Physics
- 1 Edición, Volumen 95 - 14 de marzo de 1996
- Última edición
- Editores: Peter W. Hawkes, Tom Mulvey, Benjamin Kazan
- Idioma: Inglés
Advances in Imaging and Electron Physics is the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy.… Leer más
Descripción
Descripción
Advances in Imaging and Electron Physics is the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computingmethods used in all these domains.
De interès para
De interès para
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Índice
Índice
L. Lambert and T. Mulvey, Ernst Ruska (1906–1988), Designer Extraordinaire of the Electron Microscope: A Memoir. V.T. Binh, N. Garcia, and S.T. Purcell, Electron Field Emission from Atom-Sources: Fabrication, Properties, and Applications of Nanotips. P.L. Combettes, The Convex Feasibility Problem in Image Recovery. C. Doran, A. Lasenby, S. Gull, S. Somaroo, and A. Challinor, Spacetime Algebra and Electron Physics. H.C. Shen and D. Srivastava,Texture Representation and Classification: The Feature Frequency Matrix Approach. Chapter References. Subject Index.
Reseñas
Reseñas
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."—MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."—J.A. Chapman in LABORATORY PRACTICE
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."—J.A. Chapman in LABORATORY PRACTICE
Detalles del producto
Detalles del producto
- Edición: 1
- Última edición
- Volumen: 95
- Publicado: 14 de marzo de 1996
- Idioma: Inglés
Sobre los editores
Sobre los editores
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Afiliaciones y experiencia
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceTM
Tom Mulvey
Afiliaciones y experiencia
Aston University, Department of Electronic Engineering and Applied Physics, U.K.BK
Benjamin Kazan
Afiliaciones y experiencia
Xerox Corporation, Palo Alto, California, U.S.A.Ver libro en ScienceDirect
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