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Elsevier

Advances in Imaging and Electron Physics

  • 1 Edición, Volumen 103 - 10 de agosto de 1998
  • Última edición
  • Editores: Peter W. Hawkes, Tom Mulvey, Benjamin Kazan
  • Idioma: Inglés

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy.… Leer más

Descripción

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

De interès para

AUDIENCE: Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

Índice

Contributors. Preface. E. Heyman and T. Melamed, Space-Time Representation of Ultra Wideband Signals. J.J. Koenderink and A.J. van Doorn, The Structure of Relief. C.M. Krowne, Dyadic Green's Function Microstrip Circulator Theory for Inhomogeneous Ferrite With and Without Penetrable Walls. M.I. Yavor, Charged Particle Optics of Systems with Narrow Gaps: A Perturbation Theory Approach. Subject Index.

Detalles del producto

  • Edición: 1
  • Última edición
  • Volumen: 103
  • Publicado: 10 de agosto de 1998
  • Idioma: Inglés

Sobre los editores

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Afiliaciones y experiencia
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

TM

Tom Mulvey

Afiliaciones y experiencia
Aston University, Department of Electronic Engineering and Applied Physics, U.K.

BK

Benjamin Kazan

Afiliaciones y experiencia
Xerox Corporation, Palo Alto, California, U.S.A.

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