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Elsevier

Advances in Imaging and Electron Physics

  • 1 Edición, Volumen 126 - 20 de mayo de 2003
  • Última edición
  • Editores: Peter W. Hawkes, Benjamin Kazan, Tom Mulvey
  • Idioma: Inglés

Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and it's application in a practical sense, with a… Leer más

Descripción

Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working in this field, makes this book essential reading

Puntos claves

*Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics*Emphasises theory and it's application in a practical sense *Provides the FIRST full statement of a radical new approach to 'phase calibration' and the solution of this important and difficult problem, pioneered by A, Lannes

De interès para

Researchers, academics, physicists and engineers working in the field of image and electron physics

Índice

A Wavelet-Based Method for Mutlifractal Image Analysis: From Theoretical Concepts to Experimental Applications, An analysis of the Geometric Distortions Produced by Median and Related Image Processing Filters, Two-Photon Excitation Microscopy, Phase Closure Imaging, Three Dimensional Image Processing and Optical Scanning Holography, Nonlinear Image Processing using Artificial Neural Networks

Detalles del producto

  • Edición: 1
  • Última edición
  • Volumen: 126
  • Publicado: 3 de mayo de 2012
  • Idioma: Inglés

Sobre los editores

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Afiliaciones y experiencia
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

BK

Benjamin Kazan

Afiliaciones y experiencia
Xerox Corporation, Palo Alto, California, U.S.A.

TM

Tom Mulvey

Afiliaciones y experiencia
Aston University, Department of Electronic Engineering and Applied Physics, U.K.

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