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Elsevier

Advances in Imaging and Electron Physics

  • 1 Edición, Volumen 127 - 4 de septiembre de 2003
  • Última edición
  • Editor: Peter W. Hawkes
  • Idioma: Inglés

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volu… Leer más

Descripción

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.

The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

Puntos claves

  • Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
  • Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
  • Provides a comprehensive overview of international congress proceedings and associated publications, as source material

De interès para

Researchers, academics, physicists and engineers working in the field of image and electron physics

Índice

Scanning Nonlinear Dielectric Microscopy; High Order Accurate Methods in Time-Domain Computational Electromagnetics; Pre filtering for Pattern Recognition Using Wavelet Transform and Neural Networks; Electron Optics and Electron Microscopy: Conference Proceedings and Abstracts as source Material.

Detalles del producto

  • Edición: 1
  • Última edición
  • Volumen: 127
  • Publicado: 28 de enero de 2012
  • Idioma: Inglés

Sobre el editor

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Afiliaciones y experiencia
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

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