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Elsevier

Advances in Imaging and Electron Physics

  • 1 Edición, Volumen 132 - 16 de agosto de 2004
  • Última edición
  • Autor: Peter W. Hawkes
  • Idioma: Inglés

The series bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes it essential reading.This volume looks at theory… Leer más

Descripción

The series bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes it essential reading.This volume looks at theory and it’s application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and electron physics and apply them to realistic practical situations.

Puntos claves

* Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics* Presents theory and it's application in a practical sense, providing long awaited solutions and new findings* Provides the steps in finding answers for the highly debated questions

De interès para

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Índice

Evanescent Waves in the Near and the Far Field (ARNOLDUS); Symmetry and the Karhunen-Loeve Decomposition (LAHME); Analysis of Irregularly Sampled Data: A Review (PIRODDI and PETROU); Recent Developments in the Microscopy of Ceramics (RAINFORTH); Five Dimensional Hamilton-Jacobi Approach to Relativistic Quantum Mechanics (ROSE); Redundant Multiscale Transforms and Their Application for Morphological Component Separation (STARK, ELAD and DONOHO)

Detalles del producto

  • Edición: 1
  • Última edición
  • Volumen: 132
  • Publicado: 16 de agosto de 2004
  • Idioma: Inglés

Sobre el autor

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Afiliaciones y experiencia
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

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