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Elsevier

Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

  • 1 Edición, Volumen 162 - 6 de agosto de 2010
  • Última edición
  • Editor: Peter W. Hawkes
  • Idioma: Inglés

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This se… Leer más

Descripción

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Puntos claves

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians

De interès para

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Índice

1. Energy Filtered X-ray Photoemission electronmicroscopy(EXPEEM)- Kiyotaka Asakura

2. Image contrast in aberration-corrected scanningconfocal electron microscopy- E.C. Cosgriff

3. Comparison of color demosaicing methods- O. Lossona

4. New dimensions for field emission: effects of structure in the emitting surface- C. J. Edgcombe

5. Conductivity Imaging and Generalised RadonTransform: a review- Archontis Giannakidis

6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy- A. Sever Škapin

Detalles del producto

  • Edición: 1
  • Última edición
  • Volumen: 162
  • Publicado: 6 de agosto de 2010
  • Idioma: Inglés

Sobre el editor

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Afiliaciones y experiencia
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

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