Advances in Imaging and Electron Physics
- 1 Edición, Volumen 177 - 30 de abril de 2013
- Última edición
- Editor: Peter W. Hawkes
- Idioma: Inglés
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low en… Leer más
Descripción
Descripción
Puntos claves
Puntos claves
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
De interès para
De interès para
Índice
Índice
Editor-In-Chief
Preface
Future Contributions
Contributors
Chapter One. Image Segmentation in the Field of the Logarithmic Image Processing Model: Special Focus on the Hierarchical Ascendant Classification Techniques
1 Introduction: Chapter Context and Aim
2 Multithresholding and K-Means
3 Region Growing
4 Hierarchical Ascendant Classification
5 Conclusion and Perspectives
6 Reflections on the LIP Model
References
Chapter Two. Representations for Morphological Image Operators and Analogies with Linear Operators
1 Introduction
2 Linear Spaces and Linear Image Operators
3 Lattice Spaces and Morphological Image Operators
4 Minimax Algebra and Image Operators on Complete Weighted Lattices
5 Kernel and Basis Representations of Operators on Lattices
6 Conclusions
References
Chapter Three. Electron Microscopy at Cambridge University with Charles Oatley and Ellis Cosslett: Some Reminiscences and Recollections
1 Early Years
2 Research with Professor Oatley
3 Research with Ellis Cosslett at the Cavendish Laboratory
4 Epilogue
References
Chapter Four. Advanced Methods of Electron Microscopy in Catalysis Research
1 Introduction
2 STEM and TEM
3 Examples of Applications to Catalyst Characterization
4 Electron Microscopy of Layered Materials
References
Color Plates
Index
Contents of Volumes 151-176
Detalles del producto
Detalles del producto
- Edición: 1
- Última edición
- Volumen: 177
- Publicado: 30 de abril de 2013
- Idioma: Inglés
Sobre el editor
Sobre el editor
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