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Elsevier

Advances in Imaging and Electron Physics

  • 1 Edición, Volumen 181 - 10 de enero de 2014
  • Última edición
  • Editor: Peter W. Hawkes
  • Idioma: Inglés

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This se… Leer más

Descripción

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Puntos claves

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

De interès para

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Índice

Editor-in-Chief

Preface

Future Contributions

Contributors

1. Octree Grid Topology-Preserving Geometric Deformable Model (OTGDM)

1 Introduction

2 Digital Topology on Adaptive Octree Grids

3 OTGDM

4 Experiments

5 Summary and Discussion

Appendix: Proof of Non-self-intersection of the Adaptive CCMC Algorithm

References

2. Second-order Variational Models for Image Texture Analysis

1 Introduction

2 First-order Variational Decomposition Models

3 Second-order Models (2D Case)

4 3D Second-order Models

5 Examples and Applications

Appendix A. Mathematical Tools

Appendix B. 2D-MATLAB© Codes

References

3. Electron Microscopy of Pharmaceutical Systems

1 Introduction

2 Electron Microscopy (EM) of Solid Pharmaceutical Systems

3 EM of Hydrated Pharmaceutical Systems

4 Analytical Electron Microscopy of Pharmaceutical Systems

5 Practical Application and Examples

6 Conclusions

Acknowledgments

References

Contents of Volumes 151––180

Index

Color Plates

Detalles del producto

  • Edición: 1
  • Última edición
  • Volumen: 181
  • Publicado: 10 de enero de 2014
  • Idioma: Inglés

Sobre el editor

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Afiliaciones y experiencia
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

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