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Elsevier

Advances in Imaging and Electron Physics

  • 1 Edición, Volumen 198 - 25 de octubre de 2016
  • Última edición
  • Autor: Peter W. Hawkes
  • Idioma: Inglés

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The s… Leer más

Descripción

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Puntos claves

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, and digital image processing

De interès para

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Índice

  • Della Grayson: a Tribute
  • Preface
  • Future Contributions
  • Chapter One: Direct Digital Electron Detectors
    • Abstract
    • 1 Introduction
    • 2 Detector Characterization
    • 3 Detector Types
    • 4 Future Advances
  • Chapter Two: Transmission Electron Microscopy: Emerging Investigations for Cultural Heritage Materials
    • Abstract
    • 1 Introduction
    • 2 Sampling and Sample Preparation
    • 3 Standard TEM
    • 4 Advanced Techniques and Further Developments
    • 5 Conclusion
  • Chapter Three: Quest for Ultimate Resolution Using Coherent Electron Waves: An Aberration-Corrected High-Voltage Electron Microscope
    • Abstract
    • 1 Introduction
    • 2 Resolution of TEM
    • 3 Early Efforts in Electron Microscopy
    • 4 Birth of Coherent Electron Waves
    • 5 Development of the High-Voltage Electron Microscope
    • 6 The Era of the Aberration-Corrected Electron Microscope
    • 7 Aberration-Corrected High-Voltage TEM
    • 8 Conclusion and Outlook
    • Acknowledgments
  • Index
  • Contents of Volumes 151-197

Detalles del producto

  • Edición: 1
  • Última edición
  • Volumen: 198
  • Publicado: 26 de octubre de 2016
  • Idioma: Inglés

Sobre el autor

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Afiliaciones y experiencia
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

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