Advances in Imaging and Electron Physics
- 1 Edición, Volumen 235 - 5 de agosto de 2025
- Última edición
- Editor: Martin Hÿtch
- Idioma: Inglés
Advances in Imaging and Electron Physics, Volume 235 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscop… Leer más
Descripción
Descripción
Advances in Imaging and Electron Physics, Volume 235 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology.
Puntos claves
Puntos claves
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
De interès para
De interès para
Physicists, electrical engineers, applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Índice
Índice
1. Unified formalism of light beam optics and light polarization
2. Relativistic Theory and Calculation of Electrostatic Focusing Systems
3. A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology
2. Relativistic Theory and Calculation of Electrostatic Focusing Systems
3. A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology
Detalles del producto
Detalles del producto
- Edición: 1
- Última edición
- Volumen: 235
- Publicado: 18 de agosto de 2025
- Idioma: Inglés
Sobre el editor
Sobre el editor
MH
Martin Hÿtch
Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Afiliaciones y experiencia
Senior Scientist, French National Centre for Research (CNRS), Toulouse, FranceVer libro en ScienceDirect
Ver libro en ScienceDirect
Lee Advances in Imaging and Electron Physics en ScienceDirect