Complete Subject and Author Index, Including Supplements
- 1 Edición, Volumen 104 - 1 de octubre de 1998
- Última edición
- Editores: Peter W. Hawkes, Tom Mulvey, Benjamin Kazan
- Idioma: Inglés
This much needed volume uniquely brings together all previous volumes of this well-known serial. It allows the readers the ability to navigate through the information in all the… Leer más
Descripción
Descripción
This much needed volume uniquely brings together all previous volumes of this well-known serial. It allows the readers the ability to navigate through the information in all the preceding volumes by using both author and subject indices.
De interès para
De interès para
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Índice
Índice
Complete Subject and Author Index, Including Supplements.
Reseñas
Reseñas
Praise for the Previous Volumes
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."—MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."—J.A. Chapman in LABORATORY PRACTICE
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."—MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."—J.A. Chapman in LABORATORY PRACTICE
Detalles del producto
Detalles del producto
- Edición: 1
- Última edición
- Volumen: 104
- Publicado: 1 de octubre de 1998
- Idioma: Inglés
Sobre los editores
Sobre los editores
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Afiliaciones y experiencia
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceTM
Tom Mulvey
Afiliaciones y experiencia
Aston University, Department of Electronic Engineering and Applied Physics, U.K.BK
Benjamin Kazan
Afiliaciones y experiencia
Xerox Corporation, Palo Alto, California, U.S.A.Ver libro en ScienceDirect
Ver libro en ScienceDirect
Lee Complete Subject and Author Index, Including Supplements en ScienceDirect