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Elsevier

Development of Methods for Characterisation of Roughness in Three Dimensions

  • 1 Edición - 1 de junio de 2002
  • Última edición
  • Autores: Ken J Stout, Liam Blunt, W. P. Dong, E. Mainsah, N. Luo, T. Mathia, P. J. Sullivan, H. Zahouani
  • Idioma: Inglés

Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a… Leer más

Descripción

Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard.

Puntos claves

· Updated version of noted previous publication· Contains basis, for the first time, for a unified approach to the subject· The basis for a 3D international standard

De interès para

Specialists in micro instrumentation, precision engineering practitioners and academics, mechanical, quality assurance, production engineers

Índice

1. Updating introduction to this revised reprint; 2. An integrated approach to the assessment of 3-D micro-topography; 3. Techniques and fidelity of data collection; 4. Measurement strategy of the stylus instrument; 5. Effects of stylus geometry and loading;6. Fidelity of the measurement datum; 7. The selection of sampling conditions; 8. Specification for a unified data file format; 9. Reference for 3-D topography characterisation; 10. Digital filtering of 3-D surface topography; 11. Characterisation techniques;12. Parameters for characterising 3-D surfaces; 13. The effects of quantisation on 3-D topography characterisation; 14. Functional characterisation of engineering surfaces ; 15. Calibration of surface topography instruments.

Detalles del producto

  • Edición: 1
  • Última edición
  • Publicado: 1 de junio de 2002
  • Idioma: Inglés

Sobre el autor

LB

Liam Blunt

Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).
Afiliaciones y experiencia
Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK