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From Physics to Devices: Light Emissions in Silicon

Light Emissions in Silicon: From Physics to Devices

  • 1 Edición, Volumen 49 - 14 de noviembre de 1997
  • Última edición
  • Editores: R. K. Willardson, David J. Lockwood, Eicke R. Weber
  • Idioma: Inglés

Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known author… Leer más

Descripción

Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors.The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices,Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded.Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry.

De interès para

Libraries, researchers, graduate students and practitioners in materials science (electronic materials field), and electrical engineering (field of electronic devices).

Índice

D.J. Lockwood, Light Emission in Silicon. G. Abstreiter, Light Emission in Si/Ge Atomic Layer Structures. T.G. Brown and D.G. Hall, Radiative Isoelectronic Impurities in Silicon and Silicon–Germanium Alloys and Superlattices. J. Michel, L.V.C. Assali, M.T. Morse, and L.C. Kimerling, Erbium in Silicon. Y. Kanemitsu, Silicon and Germanium Nanoparticles. P.M. Fauchet, Porous Silicon: Photoluminescence and Electroluminescent Devices. C. Delerue, G. Allen, and M. Lannoo, Theory of the Radiative and Non Radiative Processes in Silicon Nanocrystallites. L. Brus, Silicon Polymers and Nanocrystals.

Detalles del producto

  • Edición: 1
  • Última edición
  • Volumen: 49
  • Publicado: 11 de julio de 2011
  • Idioma: Inglés

Sobre los editores

RW

R. K. Willardson

Afiliaciones y experiencia
WILLARDSON CONSULTING SPOKANE, WASHINGTON

DL

David J. Lockwood

Afiliaciones y experiencia
National Research Council, Institute of Microstructure Sciences

EW

Eicke R. Weber

Afiliaciones y experiencia
Fraunhofer-Institut für Solare Energiesysteme ISE, Freiburg, Germany

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