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Elsevier

Quantitative Data Processing in Scanning Probe Microscopy

SPM Applications for Nanometrology

  • 2 Edición - 24 de enero de 2018
  • Última edición
  • Autor: Petr Klapetek
  • Idioma: Inglés

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data proc… Leer más

Descripción

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software.

Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap.

Associated data sets can be downloaded from http://gwyddion.net/qspm/

Puntos claves

  • Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques
  • Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy
  • Worked examples show quantitative data processing for different SPM analytical techniques

De interès para

Industrial and academic engineers and scientists working in nanotechnology, surface physics, materials engineering, thin film optics, life sciences, etc; SPM users and technicians; engineers and scientists utilizing SPM data

Índice

1. Motivation2. Instrumentation Principles3. Data Models4. Basic Data Processing5. Dimensional Measurements6. Force and Mechanical Properties7. Friction and Lateral Forces8. Electrostatic Fields9. Magnetic Fields10. Local Current Measurements11. Thermal Measurement12. Optical Measurements13. Sample Data Files14. Numerical Modeling Techniques

Detalles del producto

  • Edición: 2
  • Última edición
  • Publicado: 24 de enero de 2018
  • Idioma: Inglés

Sobre el autor

PK

Petr Klapetek

Petr Klapetek is Head, Department of Nanometrology at the Czech Metrology Institute, Czech Republic. His research focuses on the metrology scanning probe microscope (SPM) construction, a key standard for nanometrology.He also participates in the Gwyddion project, focused on the creation of multiplatform open-source software for scanning probe microscopy (SPM) data analysis.
Afiliaciones y experiencia
Czech Metrology Institute

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