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Elsevier

Reliability, Robustness and Failure Mechanisms of LED Devices

Methodology and Evaluation

  • 1 Edición - 23 de septiembre de 2016
  • Última edición
  • Autores: Yannick Deshayes, Laurent Bechou
  • Idioma: Inglés

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such te… Leer más

Descripción

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

Puntos claves

  • Deals exclusively with reliability, based on the physics of failure for infrared LEDs
  • Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications
  • Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution
  • Focuses on the method to extract fundamental parameters from electrical and optical characterizations

De interès para

Practitioners and engineers, small and mid-sized enterprises; postgraduate students, academics, and researchers

Índice

  • Preface
  • 1: State-of-the-Art of Infrared Technology
    • Abstract
    • 1.1 Introduction
    • 1.2 Compound materials III-V
    • 1.3 Light-emitting diodes
    • 1.4 Applications
    • 1.5 Conclusion
  • 2: Analysis and Models of an LED
    • Abstract
    • 2.1 Introduction
    • 2.2 Physicochemical analysis
    • 2.3 Electro-optical analysis
    • 2.4 Initial characterizations of 935 nm LEDs
    • 2.5 Conclusion
  • 3: Physics of Failure Principles
    • Abstract
    • 3.1 Introduction
    • 3.2 Aging tests
    • 3.3 Failure signatures
    • 3.4 Physics of failures
    • 3.5 Conclusion
  • 4: Methodologies of Reliability Analysis
    • Abstract
    • 4.1 Introduction
    • 4.2 Method based on the physics of failures
    • 4.3 Digital methods
    • 4.4 A new approach
    • 4.5 Conclusion
  • Bibliography
  • Index

Detalles del producto

  • Edición: 1
  • Última edición
  • Publicado: 23 de septiembre de 2016
  • Idioma: Inglés

Sobre los autores

YD

Yannick Deshayes

Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices. He develops quantum theory to establish degradation laws on photonics devices for LED, laser and photonics applications..
Afiliaciones y experiencia
Associate Professor, University of Bordeaux, France

LB

Laurent Bechou

Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.
Afiliaciones y experiencia
Université de Sherbrooke

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