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Elsevier

Vacuum Ultraviolet Spectroscopy II

  • 1 Edición, Volumen 32 - 4 de septiembre de 1998
  • Última edición
  • Editores: James A. Samson, Thomas Lucatorto, David L. Ederer, Marc De Graef
  • Idioma: Inglés

This volume is for practitioners, experimentalists, and graduate students in applied physics, particularly in the fields of atomic and molecular physics, who work with vacuum… Leer más

Descripción

This volume is for practitioners, experimentalists, and graduate students in applied physics, particularly in the fields of atomic and molecular physics, who work with vacuum ultraviolet applications and are in need of choosing the best type of modern instrumentation. It provides first-hand knowledge of the state-of-the-art equipment sources and gives technical information on how to use it, along with a broad reference bibliography.

De interès para

AUDIENCE: Experimental researchers, graduate students, and practitioners in applied physics, especially spectroscopic methods, optical sources in physics and engineering, and atomic and molecular physics who work in the field of vacuum ultraviolet applications.

Índice

Contributors. Volumes in the Series. Optical Systems: Monochromators and Spectrometers: M. Koike, Normal Incidence Monochromators. H.A. Padmore, M.R. Howells, and W.R. McKinney, Grazing Incidence Monochromators. J.H. Underwood, Spectrograph and Monochromators Using Varied Line Spacing Gratings. A.P. Thorne and M.R. Howells, Intermerometric Spectrometers. Detectors: J.B. West, Gas Detectors. L.R. Canfield, Photodiode Detectors. O.H.W. Siegmund, Amplifying and Position Sensitive Detectors. S.V. Bobashev, Absolute Flux Measurements. R.L. Stockbauer, Vacuum Techniques. Application: Y. Vladimirsky, Lithography. H. Ade, Spectromicroscopy. Spectroscopy: M. Ginter and K. Yoshino, Optical. T. Calcott, Fluorescence. Index.

Detalles del producto

  • Edición: 1
  • Última edición
  • Volumen: 32
  • Publicado: 4 de septiembre de 1998
  • Idioma: Inglés

Sobre los editores

JS

James A. Samson

Afiliaciones y experiencia
University of Nebraska, Lincoln, U.S.A.

TL

Thomas Lucatorto

Afiliaciones y experiencia
National Institute of Standards and Technology, Gaithersburg, Maryland, U.S.A.

DE

David L. Ederer

Afiliaciones y experiencia
Tulane University, New Orleans, Louisiana, U.S.A.

MD

Marc De Graef

Afiliaciones y experiencia
Carnegie Mellon University, Pittsburgh, Pennsylvania, U.S.A.

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