VLSI Electronics: Microstructure
- 1 Edición, Volumen 22 - 18 de mayo de 1990
- Última edición
- Autor: Anant G. Sabnis
- Idioma: Inglés
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad… Leer más
Descripción
Descripción
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
Puntos claves
Puntos claves
Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification
De interès para
De interès para
Industrial and university researchers and graduate students in electrical engineering.
Índice
Índice
Introduction. Reliability Concepts and Modeling. Electrostatic Discharge Damage. Metal Electromigration. Dielectric Breakdown. Instabilities in ICs. Packaging Related Reliability Issues. Reliability Assurance and Qualification. Each chapter includes references. Index.
Detalles del producto
Detalles del producto
- Edición: 1
- Última edición
- Volumen: 22
- Publicado: 10 de julio de 2014
- Idioma: Inglés
Ver libro en ScienceDirect
Ver libro en ScienceDirect
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